产品描述：
Engineered for high performance and reliability, this hand-held XRF analyser combines Oxford Instruments’ patented PentaPIN® detector technology offering guaranteed fast analysis and lower limits of detection for all elements of interest.
X-MET5000 XRF hand-held analyzer is built for the most demanding quality control applications:
scrap metal analysis & sorting - analysis of metals for PMI - consumer products for RoHS screening - lead in toys - compliance testing - ore exploration in mining processes - heavy metals monitoring in soils
This rugged and reliable portable XRF analyzer is IP54 (NEMA 3) approved for superior dust and splash protection.
The X-MET5000 range is perfect for the harshest environments. The battery operating time of one working day is unique and enables extended productivity without returning to base.
The powerful user programmable software delivers highly accurate results for reliable Go/No-Go decisions.
The X-MET5000 will identify material type and automatically choose the best XRF analysis method.
The current volatile price fluctuations of commodities such as gold and metals, in particular nickel, make the accurate determination of alloy composition critical in the financial success of modern recycling operations. This is why so many businesses invest in some form of metal analysis, often using portable XRF analysis for positive materials identification (PMI).
The X-MET5000 quickly and accurately measures Nickel even in concentrations below 1%. The same rugged handheld instrument can be loaded with both a metals analysis program and plastic analysis program making it ideal for the growing scope of the recycling industry. An analytical program for precious metals analysis is also available.
The X-MET5100’s major strength is its unsurpassed light element analysis capability on materials such as Mg, Al, Si and P, performing alloy analysis and grade ID in seconds. The Light Element Treatment (LET) mode enables fast and accurate analysis of the matrix elements even when the sample contains light elements like Aluminum and Silicon, without the need for vacuum pumps and helium bottles. This is not possible when using Fundamental Parameters (FP) on an analyser that does not detect the light elements.
技术参数：
The Light Element Treatment (LET) mode enables fast and accurate analysis of the matrix elements even when the sample contains light elements like Aluminum and Silicon, without the need for vacuum pumps and helium bottles. This is not possible when using Fundamental Parameters (FP) on an analyser that does not detect the light elements.
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